DEGRADAÇÃO INDUZIDA POR POTENCIAL (PID) EM MÓDULOS FOTOVOLTAICOS
UMA BREVE REVISÃO
DOI:
https://doi.org/10.59627/cbens.2022.1175Palavras-chave:
Degradação de módulos, PID, Sistemas fotovoltaicosResumo
Os módulos fotovoltaicos (FV) em usinas de energia devem suportar altas tensões de polarização entre as camadas que compõem os módulos e a estrutura de montagem em que se encontram os módulos. Assim, esta alta tensão tem aumentado a degradação de módulos em campo prejudicando o desempenho do módulo fotovoltaico, ocasionando um grande problema para a indústria fotovoltaica. Este estresse de alta tensão resulta na degradação induzida por potencial (PID – potencial induced degradation). Neste artigo será fornecida uma revisão da literatura, tendo como objetivo fornecer uma visão geral das pesquisas que foram realizadas para a compreensão do PID e a situação atual da pesquisa sobre o tema para módulos FV de silício cristalino. Este artigo consiste em três partes. Na primeira parte, são discutidas as possíveis causas do PID e o mecanismo de como essa degradação atua nos módulos de silício cristalino (c-Si), examinando como a temperatura, umidade e tensão estão correlacionadas no avanço do PID. Na segunda parte são abordados os testes usados atualmente para a avaliar a durabilidade de módulos FV para PID. Na terceira parte são apresentadas medidas preventivas contra PID a nível de célula, módulo e sistema.
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