COMPARISON OF ELECTRICAL CHARACTERISTICS OF N+NP+ SOLAR CELLS WITH TiO2 ANTIREFLECTION COATING DEPOSITED BY EVAPORATION AND CHEMICAL VAPOR DEPOSITION
DOI:
https://doi.org/10.59627/cbens.2016.1277Keywords:
Anti-reflection coating, Titanium dioxide, n-type silicon solar cellsAbstract
The boron doping of silicon wafers for solar cell production was established as standard in 1960 years, as a result of the initial use of these devices in space applications. However, it was demonstrated that doping with boron throughout the substrate can produce problems of degradation of electrical characteristics of the solar cells used in terrestrial applications. In addition, in the crystalline silicon n-type wafers, doped with phosphorus, higher minority carrier lifetime was observed, providing the fabrication of high efficiency solar cells. The aim of this work was to compare the electrical characteristics of n+np+ solar cells with TiO2 anti-reflection coating (ARC) obtained by evaporation in high vacuum with electron beam (E-beam) and by chemical vapor deposition under atmospheric pressure (APCVD). The solar cells with ARC deposited by APCVD obtained higher average efficiency, due to a larger fill factor, provided by an effective etch-trough of this film by Ag metallic paste. The most efficient solar cells presented efficiencies of 14.7% for both deposition processes used.
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